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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 796-801 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A program is under way to develop charge-coupled device (CCD) sensors for space-based x-ray astronomy imaging spectrometers. To date, laboratory line emission spectra have been acquired throughout the range of 277 to 8000 eV (carbon through copper Kα emission) and CCD sensitivity has been demonstrated throughout the range of 1.1 through 8000 eV. Image resolution is excellent, limited almost entirely by the 15-μm pixel size. These results are presented and specialized techniques are described which permit such low energy response, high spectral resolution, and efficient charge collection. Finally, analysis is presented of one particular CCD characteristic which currently limits UV and x-ray performance: charge diffusion.
    Type of Medium: Electronic Resource
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