Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
59 (1988), S. 60-63
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
In this paper a simple and inexpensive angular positioning apparatus is described which can be applied to measurements of x-ray reflectivity and extended x-ray absorption fine structure (EXAFS) at glancing angles of incidence. An efficient interactive alignment procedure is discussed and the performance of the device is given.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1139966
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