Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
60 (1989), S. 3566-3568
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Failure of vacuum valves on the JEOL 2000FX scanning transmission electron microscope (STEM) fitted with a sputter ion pump (SIP) was caused by inadequate logic control and feedback from the SIP controller to the vacuum controller. Two low-cost circuit modifications to the SIP controller solved this problem.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140515
|
Location |
Call Number |
Expected |
Availability |