ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
In many cases the fluorescence EXAFS signal is contaminated with fluorescence from nearby elements. If this fluorescence is of lower energy than the element of interest, x-ray filters are not effective. One method for dealing with this problem is the double fluorescence method described by Wong and Rao. This paper describes an improved version of this double fluorescence scheme that greatly improves its efficiency. Data are presented for a sample of 1/2% Hf in Ni3 Al, and 1.6% CuO in NiO. When standard fluorescence is used, both signals are almost completely obscured by the (approximately-equal-to)100× larger Ni K fluorescence signal. With the double fluorescence detector the Hf L3 and Cu K-edge signals are clearly observed, and good spectra can be obtained in about an hour.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140714
