ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The long trace profiler (Takacs et al.) has found significant applications in measuring the surfaces of synchrotron optics. However, requirements of small slope errors at all spatial wavelengths of the synchrotron optics mandate more accurate slope measurements. A straightness reference for the long trace profiler greatly increases the accuracy of the instrument. Methods of using the straightness reference by interpreting the sequential interference patterns are discussed and results of measurements are presented.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143036