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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 267-268 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Temperatures of a birefringent substrate (LiNbO3) have been measured by laser interferometry in a 13.56 MHz rf discharge. The measurement method is based on monitoring the variation of natural birefringence with temperature. The transient temperature rises and equilibrium values are investigated in nitrogen plasma at rf powers of ∼86 W. Owing to the large heat capacity per unit area of the substrate, the time constant of temperature rises is about ten times as large as the previously reported value of a polymer substrate (PMMA).
    Type of Medium: Electronic Resource
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