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Scanning nearfield optical microscope using microfabricated probes (1994)

Radmacher, M. ; Hillner, P. E. ; Hansma, P. K.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 65 (1994), S. 2737-2738

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: Microfabricated tips, usually used for atomic force microscopy (AFM), can be modified and used in a scanning nearfield optical microscope. Initial images show a resolution of about 80 nm (λ/8) demonstrating the quality and usefulness of these tips. They are mechanically stable, potentially commercially available, and have high light transmissibility. Furthermore, they can be easily combined with an atomic force microscope to give simultaneous nearfield optical and AFM images.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1144610

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