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A simple low-current scanning tunneling microscope (1996)

Dhirani, A. ; Fisher, A. J. ; Guyot-Sionnest, P.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 67 (1996), S. 2953-2956

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: A rigid scanning tunneling microscope design with an easily implemented two-dimensional approach is presented. Also described is a simple current–voltage converter optimized for low-current (pA) applications. Capabilities of the microscope include atomic resolution on Au(111) and molecular resolution of poorly conducting self-assembled monolayers. © 1996 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1147078

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