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Calibration of a time-resolving spectrometer in the 100–800 eV spectral region (abstract) : Proceedings of the eleventh topical conference on high temperature plasma diagnostics (1997)

Ruggles, L. E. ; Porter, Jr., J. L.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 68 (1997), S. 1063-1063

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We are calibrating a new time-resolving x-ray spectrometer used to diagnose z-pinch driven hohlraums at the Saturn Facility. The instrument uses a 5000 lines/mm transmission grating dispersing element and has an array of silicon photodiodes and a gated microchannel-plate detector for recording spectra. The diodes are located every 50 eV from 100 to 850 eV (E/ΔE=10) and have subnanosecond temporal and near-theoretical quantum efficiency. The microchannel-plate detector uses a 6.25 Ω gold stripline to record both a 5 ns frame of continuous spectrum and shadows of each silicon diode in the spectrum. This poster describes measurements of the spectral sensitivity of the instrument, including relative grating order efficiencies, microchannel-plate detector efficiency, and absolute sensitivity and time response of the silicon diodes.© 1997 American Institute of Physics. [S0034-6748(97)71001-3]

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1147788

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