ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A novel experimental setup is described which allows one to obtain detailed information on structural and dynamical changes in polymers during crystallization. This technique includes simultaneous measurements of small angle-wide angle x-ray scattering and dielectric spectroscopy (SWD). The capabilities of the technique have been probed by following in real time the crystallization process of a model crystallizable polymer: poly(ethylene terephthalate). By performing these experiments, simultaneous information from both, the amorphous and the crystalline phase is obtained providing a complete description of changes occurring during a crystallization process. The SWD technique opens up new promising perspectives for the experimental study of the relation between structure and dynamics in materials science. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1150528
