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Investigation of noise in a spectrometer system using a short-arc source (2001)

Ebert, M. ; Aspnes, D. E.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 72 (2001), S. 3477-3479

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We show that noise can be reduced significantly at certain frequencies in spectrometer systems that use arc-lamp sources if the image of the lamp is oriented perpendicular to the entrance slit of the spectrometer. This appears to be a result of aligning the direction of arc wander along, rather than across, the slit. Data on a specific system show a reduction in the appropriate Fourier component of the power density spectrum by a factor of 4. © 2001 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1384423

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