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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1506-1508 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A hard x-ray Fresnel zone-plate-based microprobe has been designed and integrated into a Newport kappa diffractometer for microdiffraction studies at the 2ID-D beamline at the Advance Photon Source. The microprobe employs 10 and 40 cm (focal length at 8 keV) zone plates to provide high and moderate focusing power, respectively. Each zone-plate assembly has two identical zone plates stacked together to provide higher focusing efficiency for higher energy (30 keV) applications. The mounting base of the microprobe is supported by the side of the base of the diffractometer at one end and the central table of the diffractometer at the other end, thus minimizing the instability of relative positions between the focal spot and the specimen. A x-ray focal spot size smaller than 360 nm and angular repeatability of the sample circles smaller than 0.001° have been demonstrated with this setup. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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