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Topological classification of defects in two-dimensional quasicrystals (1991)

Wu, Yihren ; Szeto, K. Y.

College Park, Md. : American Institute of Physics (AIP)

Journal of Mathematical Physics 32 (1991), S. 1408-1414

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ISSN: 1089-7658

Source: AIP Digital Archive

Topics: Mathematics , Physics

Notes: A new topological classification of defects in two-dimensional quasicrystals generated by the "generalized dual method (GDM)'' is presented. Two classes of defects can be obtained by considering the possible obstructions encountered during the inward growth from a loop of tiles. The first class of defects, which do not associate with Burgers' vectors, is new. A classification scheme for this class of defects is given along with examples drawn from a computer growth model in two dimensions. The second class of defects is a generalization of the work of Kleman and Pavlovitch to the GDM cases.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.529295

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