Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
58 (1985), S. 1571-1577
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Noise spectra of α-SiC in the presence of space-charge-limited flow are attributed to trapping noise. In the ohmic regime, SΔI∝ I20 and in the ohmic and low-voltage quadratic regime SΔI∝I0||V0|| as required by the theory. The trapping levels are determined from the slope of the time constants versus 1/T; the results are in fair agreement with those obtained from the current-voltage characteristic. The magnitude of the noise requires a modulation mechanism, such as caused by mobility fluctuations in the temperature range where ionized impurity scattering dominates.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.336043
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