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Analysis of multilayer thin-film structures containing magneto-optic and anisotropic media at oblique incidence using 2×2 matrices (1990)

Mansuripur, M.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 67 (1990), S. 6466-6475

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: A complete analysis of multilayer structures containing an arbitrary number of dielectric, metal, magnetic, and birefringent/dichroic layers is presented. An algorithm, based on simple 2×2 matrices, is derived which allows reflection, transmission, absorption, magneto-optic conversion, birefringence, and dichroism of the structure to be computed on a personal computer. The incident beam is assumed to be plane monochromatic with arbitrary angle of incidence. There are no approximations involved, and the results are direct consequences of Maxwell's equations.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.345121

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