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The structure and magneto-optic properties of MnAl-based thin films (1990)

Shen, J. X. ; Kirby, Roger D. ; Sellmyer, D. J.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 67 (1990), S. 4929-4931

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Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: We have measured the magnetization and magneto-optic Kerr rotation of sputtered thin films of Mn-Al-Cu ternary alloys over a wide composition range and for substrate temperatures between 25 and 450 °C. Magnetization and x-ray diffraction measurements suggest that our films are a mixture of the ferromagnetic kappa (κ) phase of MnAl and a highly paramagnetic amorphous phase. Room-temperature magneto-optic measurements on these films show a saturation polar Kerr rotation of up to 0.12° with little wavelength dependence.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.344735

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