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Photoreflectance line shapes of semiconductor microstructures (1991)

Tang, Y. S.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 69 (1991), S. 8298-8303

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: Photoreflectance line shapes of various semiconductor microstructures were discussed in this paper. Formulas suitable for application in low-dimensional structures were given and used to analyze experimental results from various semiconductor microstructures including GaAs nipi structures, GaAs/AlGaAs multiple quantum wells, InGaAs/GaAs strained-layer superlattices, and

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.347439

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