ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The effects of a magnetic underlayer on the magnetic behavior of overlayer/underlayer combinations were investigated. Permalloy underlayers of 100 nm thickness and composition 82% Ni-18% Fe by weight were sputter deposited on 3-in.-diam Si substrates. Magnetic orientations of the underlayers were set at 0°, 45°, and 90° with respect to the orientation of a subsequently plated Permalloy (79%Ni-21%Fe overlayer. Several film combinations were generated on each of the various underlayer configurations with plated thicknesses ranging from 0.1 to 2.0 μm. Spatial maps of magnetic orientation and Hk for underlayers and underlayer/overlayer combinations were collected using a modified Kerr BH imager (Kerr BHI) designed from Gudeman.1 The maps covered a 5 cm×5 cm square region with 5 mm spacing between points. Comparison of the maps before and after plating shows a partial reduction in the measured Hk values for film systems with large underlayer/overlayer orientation differences. A uniform decline in the effect of the underlayer to the overall orientation direction as film thicknesses increase was also observed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.350085
