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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 4455-4459 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The influence of the tensile stress on the flux reversal phenomena in as-quenched state of Fe77.5Si7.5B15 is investigated. A large and stable Barkhausen jump is observed at a field H*, called the switching field. The switching field H* passes through a minimum as tensile stress increases and the jump in magnetization M* at H* grows with stress. It is observed that H* of the sample can be modified by flash annealing under stress. The results on magnetic properties like coercive field, squareness ratio, power loss of as-quenched and stress-annealed samples are presented. The stress annealing induces elastic and plastic components in anisotropy.
    Type of Medium: Electronic Resource
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