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Thickness-dependent electrical characteristics of lead zirconate titanate thin films (1995)

Udayakumar, K. R. ; Schuele, P. J. ; Chen, J. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 77 (1995), S. 3981-3986

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: Ferroelectric lead zirconate titanate thin films of morphotropic phase boundary composition were fabricated through the sol-gel spin-on technique to study the thickness dependence of electrical characteristics. At saturation, the films exhibited a dielectric constant of 1300, dissipation factor of 0.03, Curie temperature of 366 °C, remanent polarization of 36 μC/cm2, coercivity of around 30 kV/cm, and dielectric breakdown strength of over 1 MV/cm. The temperature dependence of permittivity showed an anomalous behavior with annealing temperature. The high temperature dielectric behavior of the films were distinguished by smeared and stunted dielectric maximum. © 1995 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.359508

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