ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The reflectivity of circularly polarized (CP) soft x rays is a technique which combines the power of x-ray scattering and magnetic circular dichroism and allows the structural and magnetic characterization of heteromagnetic multilayers. In this technique, the energy and angular dependence of the differential reflectivity of left- and right-circularly polarized soft x rays at the relevant absorption edges of the constituent elements of the multilayers are measured. As examples the reflectivity curves for single films of Fe, Co, ordered and disordered Fe50Co50 alloys, and for a trilayer consisting of two single crystal Fe30Co70 films separated by an 8.7 A(ring) Mn spacer layer media utilizing complex dielectric tensors with no free parameters show that the rich reflectivity curves can be used to determine the multilayer magnetic ordering, film thicknesses, interface quality, as well as differentiating between ordered and disordered alloys. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.362452