ALBERT — All Library Books, journals and Electronic Records Telegrafenberg

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

CuInS2 thin film growth monitoring by in situ electric conductivity measurements (1997)

Alt, M. ; Lewerenz, H. J. ; Scheer, R.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 81 (1997), S. 956-959

add to mindlist on the mindlist

Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The growth of CuInS2 thin films by coevaporation has been monitored by in situ electrical conductivity measurements. Films with different cation ratio In/(In+Cu) were investigated. During the controlled cool-down period we obtain conductivity versus temperature data which are completed ex situ in the low-temperature region. The formation of the semimetallic CuS phase in Cu-rich films is found during the cool-down period at a substrate temperature of about 450 K. For In-rich films the dominance of charged grain boundary states is discussed. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.364224

	Location	Call Number	Expected	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit