ALBERT — All Library Books, journals and Electronic Records Telegrafenberg

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

Field inhomogeneity effects on photoreflectance spectra of ZnSe/GaAs (2000)

Song, J. H. ; Sim, E. D. ; Baek, K. S. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 87 (2000), S. 3789-3792

add to mindlist on the mindlist

Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: Photoreflectance measurements from ZnSe epilayers of different thicknesses were carried out. In photoreflectance spectra, the exciton line shape "rotation" is observed to be much slower than that in the reflectance spectra by increasing the epilayer thicknesses. To analyze the exciton line shape rotation quantitatively, the photoreflectance spectra were calculated considering the built-in electric field inhomogeneity effects near the interface as well as the interference effects. Calculated line shapes of the photoreflectance spectra show a good agreement with the observations. Our results imply that inhomogeneity effects of the interface built-in electric field plays an important role in the spectral rotation in photoreflectance. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.372415

	Location	Call Number	Expected	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit