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Wavelength dependence of photorefractive effect in Ti-indiffused LiNbO3 waveguides (1989)

Fujiwara, T. ; Sato, S. ; Mori, H.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 54 (1989), S. 975-977

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: A novel method of measuring the photorefractive sensitivity of Ti-diffused channel waveguides in lithium niobate is proposed and demonstrated. It is suited for quantifying the dependence of the photorefractive sensitivity on the irradiation beam wavelength. From measurements at various irradiation intensities and wavelengths 0.633, 0.81, and 1.06 μm, we give an estimate of the crosstalk of a directional coupler as a function of irradiation intensity and wavelength.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.101421

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