Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
54 (1989), S. 413-415
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The efficiency of interfacial ion mixing is measured for metal/Al (metal=Ti, Cr, Ni, and Mo) thin-film bilayers irradiated with 285 keV Xe+ ions near 77 K. The results indicate that, as a group, mixing of 3d-metal/Al pairs irradiated by Xe can be explained by neither a pure binary collision cascade nor a pure thermal spike model. Such a situation should exist; that it should be found at the average atomic numbers of the present bilayers is consistent with recent theoretical predictions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.100937
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