Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
55 (1989), S. 2233-2235
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We report on electrical noise measurements made on YBCO (Y1 Ba2 Cu3 O7−x ) films on SrTiO3 , on bulk silicon with a ZrO2 buffer layer, and on thin dielectric membranes. We have found that 1/f noise predominates in the unoriented films and that thermal fluctuation noise is the chief source of noise in good films on SrTiO3 .
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.102355
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