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Measurement of elastic relaxation in cross-sectional transmission electron microscopy of GexSi1−x/Si strained-layer superlattices (1992)

Duan, X. F.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 61 (1992), S. 324-326

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Two types of relaxation occur in the cross-sectional transmission electron microscopy samples of the GexSi1−x/Si strained-layer superlattices (SLS) by large-angle convergent-beam electron diffraction (LACBED) and imaging technique which gives a good LACBED pattern superimposed on a high spatial resolution shadow image of the SLS. One type of relaxation occurs between the Si and the GeSi layers. It is negligible in the convergent-beam electron diffraction (CBED) case for the larger value of the ratio of the sample thickness to the SLS wavelength. Another type occurs between the superlattice as an average crystal and the Si substrate. The relaxation of the SLS can be measured by the shift of the Kikuchi line in the SLS from that in the Si substrate.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.107925

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