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Aging of critical currents and irreversibility line in melt textured YBa2Cu3O7 (1995)

Martínez, B. ; Sandiumenge, F. ; Piñol, S. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 66 (1995), S. 772-774

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: The critical currents and the irreversibility line of bulk melt textured YBa2Cu3O7 have been found to evolve with the increase of the oxygenation time. A strong field-dependent reduction of the critical currents is observed which finally leads to a downward shift of the irreversibility line. Transmission electron microscopy micrographs of aged samples display a huge increase in the concentration of stacking faults near the microcracks and at the YBa2Cu3O7-Y2BaCuO5 interfaces. Low field ac susceptibility measured with H(parallel)ab shows a strong reduction of the screening capability thus meaning that nonsuperconducting planar defects parallel to the ab planes have been created. We suggest that an enhanced two-dimensional behavior of the vortex flux lattice occurs when H(parallel)c as a consequence of this layered defective structure. © 1995 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.114089

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