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Charge–carrier diffusion length in photorefractive crystals computed from the initial hologram phase shift (1997)

Freschi, A. A. ; Garcia, P. M. ; Frejlich, J.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 71 (1997), S. 2427-2429

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: The phase shift between the pattern of light onto a photorefractive crystal and the resulting hologram at the very beginning of the recording process in two-wave mixing is analyzed and measured as a function of the applied electric field. These data allow one to compute the diffusion length of photoexcited charge carriers and to evaluate the actual electric field inside the crystal. A diffusion length of 0.14 μm is measured in a nominally undoped photorefractive Bi12TiO20 crystal using a 532 nm wavelength laser illumination, in agreement with results obtained from other methods. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.120116

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