Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
75 (1999), S. 902-904
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Well-crystallized SrBi2Ta2O9 (SBT) thin films with good surface morphology were prepared on quartz substrates by the pulsed laser deposition technique at a deposition temperature of 750 °C. The third-order nonlinear optical properties of the films were measured by the Z-scan technique. The magnitude and sign of the nonlinear refractive index n2 were determined, as was the negative sign, which indicated a self-defocusing optical nonlinearity. A nonlinear refractive index as high as 1.9×10−6 esu was displayed in the SBT thin film. These results show that SBT ferroelectric thin films have potential applications in nonlinear optics. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.124548
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