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Atomic force microscopy using an integrated comb-shape electrostatic actuator for high-speed feedback motion (2000)

Akiyama, T. ; Staufer, U. ; de Rooij, N. F.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 76 (2000), S. 3139-3141

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: A microfabricated cantilever with integrated comb-shape electrostatic actuator is proposed to yield a high-speed feedback motion in atomic force microscopy with optical deflection detection. The actuator has a linear response to the driving voltage. The dynamic range of tip amounts to 1 μm with an actuation efficiency of 11.4 nm/V. Using this cantilever, an imaging bandwidth of ∼80 kHz was obtained. High-speed constant force imaging with a tip velocity of 1.22 mm/s is demonstrated. The tip-sample force is verified to be constant by using a cantilever with an integrated piezoresistor as the scanned sample. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.126549

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