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Effect of interfacial strain on critical temperature of YBa2Cu3O7−δ thin films (2000)

Zhai, H. Y. ; Chu, W. K.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 76 (2000), S. 3469-3471

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Ultrathin YBa2Cu3O7−δ (YBCO) films down to two unit cells thick have been prepared on LaAlO3 (LAO) and SrTiO3 (STO) substrates for the study of substrate-induced strain effects on critical transition temperature (Tc). The YBCO on LAO has a higher Tc than that on STO for very thin films, and this Tc difference increases with reduction of film thickness. X-ray diffraction experiments reveal that compressive strain exists in the a–b plane for YBCO thin films on LAO, while tensile strain occurs for films on STO. The different stresses in these films account for the Tc difference. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.126680

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