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Spatially localized dynamic properties of individual interfaces in semiconducting oxides (2000)

Huey, Bryan D. ; Bonnell, Dawn A.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 76 (2000), S. 1012-1014

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Local electronic property variations at individual interfaces have been determined using scanning surface potential microscopy, a variant of atomic force microscopy in conjunction with locally applied electric fields. Micropatterning is used to isolate individual interfaces and position contacts so that biases can be controlled locally. Positional variations in the voltage dependent interface charge and density of states in polycrystalline zinc oxide are determined from surface potential imaging. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.125923

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