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Anisotropic ferroelectric properties of epitaxially twinned Bi3.25La0.75Ti3O12 thin films grown with three different orientations (2002)

Lee, Ho Nyung ; Hesse, Dietrich

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 80 (2002), S. 1040-1042

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Epitaxially twinned (001)- , (118)- , and (104)-oriented La-substituted Bi4Ti3O12 (BLT) ferroelectric films have been grown by pulsed laser deposition on (001)- , (011)- , and (111)-oriented SrTiO3 single-crystal substrates, respectively, covered with SrRuO3. Well-defined (001)-oriented BLT films were grown at a substrate temperature as low as 600 °C. By x-ray diffraction characterization it has been found that the low-index three-dimensional epitaxial orientation relationship BLT(001)||SrRuO3(001)||SrTiO3(001); BLT[11¯0]||SrRuO3[100]||SrTiO3[100] is valid for all epitaxially twinned BLT thin films grown on SrRuO3-covered SrTiO3 substrates in spite of their different orientations. The (104)-oriented BLT films showed an about 1.5 times higher remanent polarization (2Pr=31.9 μC/cm2) than the (118)-oriented BLT films (2Pr=20.7 μC/cm2), while (001)-oriented BLT films revealed only a small polarization component (2Pr=1.1 μC/cm2), thus demonstrating the ferroelectric anisotropy. © 2002 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1447321

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