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  • 1
    Electronic Resource
    Electronic Resource
    Fluorescence spectroscopy and transmission electron microscopy of the same isolated semiconductor nanocrystals (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 81 (2002), S. 1116-1118 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a method to establish a correlation between the crystalline structure and the fluorescence properties of isolated semiconductor nanocrystals. By using ultrathin silicon nitride substrates with markers, we have localized and investigated the same particles in both a high-resolution transmission electron microscope (TEM) and a confocal optical microscope. We have found that the observation of strong fluorescence emission does not require single domain particles. Additionally, we have correlated the size and shape of a particle as determined by TEM and its spectral properties like emission wavelength and spectral diffusion. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1499221
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