ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A method of subsurface layer structure investigation based on the measurement of diffraction as well as reflection in grazing-incidence geometry is presented. A specific feature of this method is that the incident beam is nearly parallel to the surface and suffers diffraction along with reflection, which leads to a significant decrease of the radiation penetration depth. As a result, the above methods turn out to be rather sensitive to the structure of thin (1–100 nm) crystal layers near the surface. The effect of an amorphous layer on the angular dependence of grazing X-ray scattering is studied. The theoretical part of the work is based on the well known Parratt formulae for the reflection coefficient and also on the modified two-wave diffraction theory.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889889003882
