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A cell model for X-ray scattering from random systems (1981)

Coppa, N. ; Goodisman, J.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 14 (1981), S. 309-314

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: A model, belonging to the class of cell models previously introduced, is developed to calculate the small-angle X-ray scattering of random multiphase systems. This model, which is applied to supported metal catalysts, involves two cell sizes, one for the support and one for the metal. Interphase surface areas and the correlation function, related to the X-ray scattering intensity by a Fourier transform, are given in terms of these two parameters. By fitting the measured intensity I(h) to that predicted by the model, values for the metal and support surface areas are obtained.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889881009448

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