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Diffraction by layer structures containing different kinds of layers and stacking faults (1981)

Plançon, A.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 14 (1981), S. 300-304

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: A description is given of a mathematical formalism which allows the study of diffraction by stacks which contain, simultaneously or not, (i) layers of different kinds, (ii) different translations or rotations between layers and (iii) different thicknesses. The formalism allows the calculation of intensities for all the hkl reflections or (h,k) reciprocal rods, and not just the 00l reflections. It accounts for an Sth-neighbour interaction (S≥1).

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889881009424

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