Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
14 (1981), S. 124-130
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The sources of systematic error in the X-ray diffractometer method of stress measurement are discussed. The errors in stress measurement and correction procedures for their elimination are described and quantitatively assessed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S002188988100890X
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