Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
14 (1981), S. 3-7
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
There has recently been an increased amount of interest in laboratory equipment for extended X-ray absorption fine-structure (EXAFS) measurements. In an earlier paper a facility for performing such measurements easily in a few hours was described in some detail. In this paper, further development of the techniques is reported. The use of high-power rotating-anode X-ray generator, the design of an X-ray curved-crystal spectrometer, the factors governing the proper choice of monochromator crystals and the design of fast-counting detectors and electronics are discussed. In addition, it is shown how errors caused by characteristic lines in the spectrum can be eliminated by use of a flux stabilization circuit.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889881008571
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