ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A dual-beam three-crystal spectrometer for high-sensitivity lattice-parameter comparison measurements of high-perfection crystals is described. It has a sensitivity, Δd/d, of up to ±3 x 10−8 when CuKα1 radiation is used. This spectrometer is also employed as a high-sensitivity double-crystal topographic camera. Examples of applications to doped float-zone and epitaxic layers of silicon crystals are reported, together with low- and high-temperature measurements done with a cryostat designed for high thermal stability.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889880011946