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The determination of diffuse-boundary thicknesses of polymers by small-angle X-ray scattering (1980)

Koberstein, J. T. ; Morra, B. ; Stein, R. S.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 13 (1980), S. 34-45

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: Thermal density fluctuations within phases and finite interphase widths lead to systematic deviations from Porod's law. The validity of present methods used to analyze these deviations and determine diffuse-boundary widths is determined. In view of the inadequacies found in these methods, a simple yet accurate method is proposed to determine the diffuse-boundary width from direct graphical analysis of slit-smeared intensity data. The diffuse interface is modelled by a sigmoidal-gradient model which is justified on thermodynamic grounds, with the interphase thickness as a function of the Flory–Huggins interaction parameter.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889880011478

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