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    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 12 (1979), S. 489-501 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: In recent years, nonlinear d versus sin2 ψ distributions have been observed in stressed materials which cannot be explained by the classical fundamentals of X-ray stress measurement, d is the interplanar spacing measured and ψ is the angle between the surface normal of the sample and the measuring direction. This paper reviews treatments for these nonlinear distributions, including stress gradients, shear stresses and anisotropic X-ray elastic constants. Methods for the evaluation of stresses are reported, and recommendations are given for the practical application of X-ray stress measurement.
    Type of Medium: Electronic Resource
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