ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
A new method is proposed to estimate the defocus (Δf) from a single electron micrograph (EM). The method has been tested by simulations using theoretical EM's calculated under different defocus conditions. The preliminary method is successful except when the EM is taken near the optimum defocus. This can be improved by making use of the information from the electron diffraction pattern. The method will be effective for radiation-sensitive materials.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0108767386099129