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Direct phasing of electron diffraction data from organic crystals: the effect of n-beam dynamical scattering (1979)

Dorset, D. L. ; Jap, B. K. ; Ho, M. H. ; [et al.]

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 35 (1979), S. 1001-1009

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ISSN: 1600-5724

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Chemistry and Pharmacology , Geosciences , Physics

Notes: The conditions under which direct phasing methods might be used to determine the crystallographic phases from electron diffraction intensity data are investigated through numerical calculations for two organic crystals. The Cowley-Moodie multislice formulation of dynamical diffraction theory is used to calculate the diffraction intensity data for various crystal thicknesses, at electron energies of 100 keV and 1.0 MeV. The direct phasing method is found to give generally correct phases up to a crystal thickness of about 75 Å at 100 keV. The use of higher electron energy (i.e. 1.0 MeV) produces a significant improvement in the success of the direct phasing approach at crystal thicknesses greater than 75 Å.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0567739479002217

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