Electronic Resource
[S.l.]
:
International Union of Crystallography (IUCr)
Acta crystallographica
33 (1977), S. 813-818
ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
In a spectrometer with finite beam divergence the vertical size of the reflections will increase with the order of reflection. This effect will be more pronounced if the mosaic width of the sample is large, which is often the case with biological samples. When the size of the reflection is greater than the detector size, a correction factor has to be introduced to account for this loss of intensity. A method of calculating this correction factor for a given beam divergence and mosaic width has been developed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0567739477001971
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