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  • 1
    Electronic Resource
    Electronic Resource
    A study of fatigue crack growth under random stresses in the aspect of statistics (1988)
    Springer
    Acta mechanica solida Sinica 1 (1988), S. 51-60 
    Details
    ISSN: 0894-9166
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract A CCT experiment controlled by pseudo random signals generated by a white-noise generator with narrow-band filter has been done in the MTS-880 system to compare the effects of different δK char on dα/dt. A fatigue crack growth life prediction formula which is only dependent on Power Spectrum Density (P. S. D.) of the history under Gaussian narrow-band history is derived. The theoretical results are in good agreement with the experimental ones.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02207434
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