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Noise characteristics of a superlattice avalanche photodiode (1989)

Chakrabarti, P. ; Choudhury, S. C. ; Pal, B. B.

Springer

Applied physics 48 (1989), S. 331-334

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ISSN: 1432-0630

Keywords: 72.70 ; 79.20 ; 85.60

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract The noise generated due to randomness of multiplication process in the avalanche region of an Al x Ga1−x As/GaAs quantum well p+-i-n+ structure has been studied. The paper presents a quantitative evaluation of the noise performance of the superlattice APD which has not been done so far. Further, useful design data for low noise structure is given.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00618894

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