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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 30 (1983), S. 123-126 
    ISSN: 1432-0630
    Keywords: 61.70
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The displacement field around a dislocation loop had been calculated to give the diminishing factor of X-ray diffraction intensity from a fatigued Al sample. Experimentally had been measured this factor on the samples fatigued at room temperature and at low temperature. From these the size and density of dislocation loops can be deduced. Results show that in the sample fatigued at room temperature there is no significant change in dislocation structure while at low temperature in fatigued sample occurs a large amount of dislocation loops whose density is 1014−1017cm−3 while their radii are between 100 and 1000 Å.
    Type of Medium: Electronic Resource
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