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Composition profile in semiconducting alloys by second derivative wavelength modulation (1980)

Montegu, B. ; Laugier, A. ; Chevallier, J. ; [et al.]

Springer

Applied physics 22 (1980), S. 403-408

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ISSN: 1432-0630

Keywords: 07 ; 64 ; 78.20

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract The wavelength (λ) and composition (x) modulations are used simultaneously in order to obtain the second derivative ∂2 R/∂λ∂x of the reflectivity. A great sensitivity to a small composition difference is obtained. This method is applied to the determination of the compositional profile for a ternary alloy Mg x Zn1−x Te withx〈0.01. A good agreement is observed with the theoretical profile calculated on the basis of a regular associated solution model.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00901065

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